Paper title: |
Risk Extraction and Analysis of Technical Specifications Based on Machine-Learning Algorithms for EPC Bid Documents |
Authors: |
M Park, S-y Lee, J-h Kim, E-b Lee |
Summary: |
w78-2021-paper-021.pdf |
Type: |
conference paper |
Year of publication: |
2021 |
Keywords: |
Technical Specifications, Risk Extraction, Machine Learning Algorithm, Decision Support System, EPC |
Series: |
w78:2021 |
ISSN: |
2706-6568 |
Download paper: |
/pdfs/w78-2021-paper-021.pdf |
Citation: |
M Park, S-y Lee, J-h Kim, E-b Lee (2021).
Risk Extraction and Analysis of Technical Specifications Based on Machine-Learning Algorithms for EPC Bid Documents. Proceedings of the 38th International Conference of CIB W78, Luxembourg, 13-15 October, pp 204-213 (ISSN: 2706-6568),
http://itc.scix.net/paper/w78-2021-paper-021
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